The localization properties of the single-particle and collective electron excitations were investigated in the intentionally disordered GaAs/AlGaAs superlattices by weak field magnetoresistance and Raman scattering. The localization length of the individual electron was found to be considerably larger than that one of the collective excitations. This suggests that the disorder has weaker effect on the electrons than on their collective motion and that the interaction which gives rise to the collective effects increases localization.

The formation of the miniband electron energy structure was explored in doped InGaAs/InP superlattices with different periods. The analysis of the Raman data allowed us to conclude that in spite of the defect structure of the layers constituting the superlattices, their super-periodicity was well defined. The quantitative proof of the conditions for break-down of the Raman selection rules is presented: the emergence of the selection rules of the coupled plasmon-LO phonon vibrations was demonstrated to occur due to the increase of their coherence lengths. In addition, the expected anisotropy of the effective electron masses was found by high-field magnetoresistance.

An electrostatic model was presented for the calculation of the capacitance-voltage characteristics of a semiconductor structure where quantum dots were embedded. The model was based on the linear coupling between the contributions of the quantum dots and the bulk host. We further applied this model to an InAs/GaAs self-assembled quantum dots system. The calculated capacitance was found in good agreement with the experimental curves, providing parameters of the dots ensemble, as the excitation energy of the confined electrons.

The characteristics of multi-layered InAs/GaAs self assembled quantum dots (SAQDs) annealed after the growth were here studied using a combination of capacitance-voltage (C-V) measurements,Raman scattering and photoluminescence (PL) spectroscopy. The combination of the results obtained with the three techniques, gave evidences that the annealing at 500º C causes the sharpness of the SAQDs interfaces, while the annealing at 600º C eliminated the SAQDs. However, the comparison with the case of single layered SAQDs, revealed a thermal stability of the last system even at an annealing temperature of 700º C, thus confirming the role of the interlayer strain in the low temperature diffusion process.